
Research update
DTCO study supported by experimental demonstration of hybrid channel orientations which are needed for A3

Technology review
Dimensional scaling, process simplification, and design flexibility – key drivers of High NA EUV lithography

Press releases
25 February 2026
The findings reveal that controlling gas composition, especially oxygen levels, during critical lithography steps dramatically optimizes metal-oxide resist performance for next-generation, high-throughput EUV patterning.

Press releases
17 February 2026
Patented linearization and switched input buffer techniques ensure precise signal conversion and wide bandwidth at high speeds.

Page-turner
Improving GaN device architectures, substrates, and IC design to boost power conversion efficiencies across industries.

Press releases
12 February 2026
Affordable chip design tools, MPW services and training to empower research and innovation across Europe.